Invention Grant
US07651897B2 Integrated circuit with metal heat flow path coupled to transistor and method for manufacturing such circuit
有权
具有耦合到晶体管的金属热流路的集成电路和用于制造这种电路的方法
- Patent Title: Integrated circuit with metal heat flow path coupled to transistor and method for manufacturing such circuit
- Patent Title (中): 具有耦合到晶体管的金属热流路的集成电路和用于制造这种电路的方法
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Application No.: US11869857Application Date: 2007-10-10
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Publication No.: US07651897B2Publication Date: 2010-01-26
- Inventor: Vladislav Vashchenko , Peter J. Hopper , Yuri Mirgorodski
- Applicant: Vladislav Vashchenko , Peter J. Hopper , Yuri Mirgorodski
- Applicant Address: US CA Santa Clara
- Assignee: National Semiconductor Corporation
- Current Assignee: National Semiconductor Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Girard & Equitz LLP
- Main IPC: H01L21/86
- IPC: H01L21/86

Abstract:
A method for manufacturing a chip with a metal heat flow path extending between a terminal of a transistor thereof and bulk semiconductor material of the chip (e.g., from the terminal to a substrate over which the transistor is formed or to the body of a semiconductor device adjacent to the transistor). The chip can be implemented by a semiconductor on insulator (SOI) process and can include at least one bipolar or MOS transistor, an insulator underlying the transistor, a semiconductor substrate underlying the insulator, and a metal heat flow path extending between a terminal of the transistor through the insulator to the substrate. Preferably, the metal heat flow path is a metal interconnect formed by a process step (or steps) of the same type performed to produce other metal interconnects of the chip.
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