Invention Grant
- Patent Title: Method for fabricating semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US11319249Application Date: 2005-12-27
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Publication No.: US07651898B2Publication Date: 2010-01-26
- Inventor: Dae-Young Seo
- Applicant: Dae-Young Seo
- Applicant Address: KR Kyoungki-Do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Kyoungki-Do
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Priority: KR10-2005-0027361 20050331
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
First gate lines are formed on a substrate. An insulation layer is formed on the substrate and the first gate lines. The insulation layer disposed between the first gate lines is selectively etched, to thereby form first openings. Landing plugs are buried into the first openings. The insulation layer disposed on the first gate lines is etched until upper portions of the first gate lines are exposed, thereby obtaining second openings. Second gate lines are formed inside the second openings.
Public/Granted literature
- US20060223297A1 Method for fabricating semiconductor device Public/Granted day:2006-10-05
Information query
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