Invention Grant
- Patent Title: Non-contact probe control interface
- Patent Title (中): 非接触式探头控制接口
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Application No.: US11494972Application Date: 2006-07-28
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Publication No.: US07652275B2Publication Date: 2010-01-26
- Inventor: Paul Gladnick
- Applicant: Paul Gladnick
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01N21/86
- IPC: G01N21/86 ; G01C3/08 ; G01R27/26

Abstract:
A probe control interface is provided for a structured light non-contact coordinate measuring machine probe. Portions of a video control signal for controlling the grey level of selected rows of pixels of a spatial light modulator of the probe can be decoded into control signals for additional probe components or functions that have been added to increase the measuring capabilities or versatility of the non-contact probe. By providing the additional probe component control signals in this manner, a versatile structured light non-contact probe system can be made compatible with a standard probe head autojoint system (e.g. a Renishaw™ type system), thus allowing the probe to be automatically exchanged with other standard probes and allowing existing systems to use the non-contact probe more easily. Various aspects of the probe control interface allow for relatively simple, compact, lightweight and robust implementation.
Public/Granted literature
- US20080024793A1 Non-contact probe control interface Public/Granted day:2008-01-31
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