Invention Grant
US07652276B2 Defect inspection method, defect inspection apparatus having a mounting table with a substrate thereon and an image pickup device are relatively moved for capturing the image of the substrate, and computer readable storage medium storing a program for performing the method
有权
相对移动缺陷检查方法,具有其上具有基板的安装台和图像拾取装置的缺陷检查装置用于捕获基板的图像,以及存储用于执行该方法的程序的计算机可读存储介质
- Patent Title: Defect inspection method, defect inspection apparatus having a mounting table with a substrate thereon and an image pickup device are relatively moved for capturing the image of the substrate, and computer readable storage medium storing a program for performing the method
- Patent Title (中): 相对移动缺陷检查方法,具有其上具有基板的安装台和图像拾取装置的缺陷检查装置用于捕获基板的图像,以及存储用于执行该方法的程序的计算机可读存储介质
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Application No.: US11698049Application Date: 2007-01-26
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Publication No.: US07652276B2Publication Date: 2010-01-26
- Inventor: Makoto Hayakawa , Hiroshi Tomita
- Applicant: Makoto Hayakawa , Hiroshi Tomita
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2006-031126 20060208; JP2007-002440 20070110
- Main IPC: G01N21/86
- IPC: G01N21/86

Abstract:
In the present invention, an image pickup device moving by drive of a drive unit picks up an image of a substrate on a mounting table. The drive unit is controlled by a driving signal from a first controller. The driving signal outputted to the first controller is outputted also to a second controller, so that the second controller controls the image pickup device based on the driving signal. The movement of the image pickup device itself is synchronized with the image pickup by the image pickup device. According to the present invention, at the time when the mounting table mounting the substrate thereon and the image pickup device are relatively moved to capture the image of the substrate, a precise image without image distortion can be captured for accurate inspection.
Public/Granted literature
- US20070188832A1 Defect inspection method, defect inspection apparatus, and computer readable storage medium Public/Granted day:2007-08-16
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