Invention Grant
- Patent Title: Ambipolar transistor design
- Patent Title (中): 双极晶体管设计
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Application No.: US11697604Application Date: 2007-04-06
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Publication No.: US07652339B2Publication Date: 2010-01-26
- Inventor: Yiliang Wu , Beng S. Ong , Alphonsus Hon-Chung Ng
- Applicant: Yiliang Wu , Beng S. Ong , Alphonsus Hon-Chung Ng
- Applicant Address: US CT Norwalk
- Assignee: Xerox Corporation
- Current Assignee: Xerox Corporation
- Current Assignee Address: US CT Norwalk
- Agency: Oliff & Berridge, PLC
- Main IPC: H01L29/73
- IPC: H01L29/73 ; H01L29/735 ; H01L23/31

Abstract:
An ambipolar transistor, including a p-type semiconductor region and an n-type semiconductor region near the p-type semiconductor region. Also a first terminal and second terminal contact both the p-type semiconductor region and the n-type semiconductor region. Furthermore, the p-type semiconductor region and the n-type semiconductor region substantially do not overlap each other. A method of manufacturing an ambipolar transistor is also disclosed, including forming a p-type semiconductor region, forming an n-type semiconductor region near the p-type semiconductor region, forming a first terminal contacting both the p-type semiconductor region and n-type semiconductor region, forming a second terminal contacting both the p-type semiconductor region and n-type semiconductor region; and wherein the p-type semiconductor region and the n-type semiconductor region substantially do not overlap, and have substantially no interfacial area.
Public/Granted literature
- US20080246095A1 AMBIPOLAR TRANSISTOR DESIGN Public/Granted day:2008-10-09
Information query
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