Invention Grant
- Patent Title: Correction of measured values for a magnetic localization device
- Patent Title (中): 校正磁定位装置的测量值
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Application No.: US10598013Application Date: 2005-02-11
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Publication No.: US07652468B2Publication Date: 2010-01-26
- Inventor: Sascha Kruger , Hans-Aloys Wischmann , Holger Timinger , Jorg Sabczynski , Jorn Borgert
- Applicant: Sascha Kruger , Hans-Aloys Wischmann , Holger Timinger , Jorg Sabczynski , Jorn Borgert
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP04100639 20040218
- International Application: PCT/IB2005/050530 WO 20050211
- International Announcement: WO2005/082247 WO 20050909
- Main IPC: G01B7/0004
- IPC: G01B7/0004 ; G01B7/14 ; A61B5/05

Abstract:
The invention relates to a device and a method for correction of the position (x) of a field sensor (4) measured by means of a magnetic localization device. External field distortions, such as caused for example by the rotating components (1a, 1b) of a computer tomograph (1), are then determined with the help of reference sensor (3) placed at a known position. It is possible to deduce, for example, the current angle of rotation (Φ) of the computer tomograph (1) from the measurement signals of the reference sensor (3). Based on an empirically determined correction (δ(x, Φ)), the uncorrected determined positions (x) of the field sensor (4) can then be converted to corrected positions (x′) in relation to the field distortions. The field generator (2) and the reference sensor (3) are preferably fastened to the gantry in order to eliminate the dependency of the field distortions on an inclination of the gantry.
Public/Granted literature
- US20080157755A1 Correction of Measured Values for a Magnetic Localization Device Public/Granted day:2008-07-03
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