Invention Grant
US07652657B2 Method and system for determining characteristics of optical signals on spatial light modulator surfaces 有权
用于确定空间光调制器表面上光信号特性的方法和系统

  • Patent Title: Method and system for determining characteristics of optical signals on spatial light modulator surfaces
  • Patent Title (中): 用于确定空间光调制器表面上光信号特性的方法和系统
  • Application No.: US11610394
    Application Date: 2006-12-13
  • Publication No.: US07652657B2
    Publication Date: 2010-01-26
  • Inventor: Benjamin Lowell Lee
  • Applicant: Benjamin Lowell Lee
  • Applicant Address: US TX Dallas
  • Assignee: Texas Instruments Incorporated
  • Current Assignee: Texas Instruments Incorporated
  • Current Assignee Address: US TX Dallas
  • Agent Dawn V. Stephens; Wade James Brady, III; Frederick J. Telecky, Jr.
  • Main IPC: G09G3/34
  • IPC: G09G3/34
Method and system for determining characteristics of optical signals on spatial light modulator surfaces
Abstract:
The present application describes a system and method for determining characteristics (e.g., exact band location, orientation and height and the spot shape and size of a single wavelength and the like) of an optical signal projected on a spatial light modulator. In an embodiment, images with sharper edges (i.e. clear boundary between ‘on’ pixels and ‘off’ pixels) on the spatial light modulator are used to obtain spectral information from a referenced broadband source. The spectral information can be used to determine the desired characteristics of optical signals projected on the spatial light modulator.
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