Invention Grant
- Patent Title: Exposure apparatus and device manufacturing method
- Patent Title (中): 曝光装置和装置制造方法
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Application No.: US12101314Application Date: 2008-04-11
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Publication No.: US07652748B2Publication Date: 2010-01-26
- Inventor: Chiharu Kido , Hiroyuki Maruyama
- Applicant: Chiharu Kido , Hiroyuki Maruyama
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2005-078840 20050318
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42 ; G03B27/58

Abstract:
An exposure apparatus for exposing a substrate through a reticle. The apparatus includes a chamber in which an exposure process is to be carried out, a circulation system configured to circulate a gas through the chamber, a supplying system configured to supply water, supplied from a facility, to a heat source inside the exposure apparatus, and a heat exchanger configured to perform heat exchange between a gas discharged out of the chamber by the circulation system and the water to be supplied to the heat source by the supplying system.
Public/Granted literature
- US20080246930A1 Exposure Apparatus and Device Manufacturing Method Public/Granted day:2008-10-09
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