Invention Grant
- Patent Title: Overcurrent detecting circuit and reference voltage generating circuit
- Patent Title (中): 过电流检测电路和参考电压发生电路
-
Application No.: US11516581Application Date: 2006-09-07
-
Publication No.: US07652861B2Publication Date: 2010-01-26
- Inventor: Kouhei Yamada
- Applicant: Kouhei Yamada
- Applicant Address: JP Tokyo
- Assignee: Fuji Electric Device Technology Co., Ltd.
- Current Assignee: Fuji Electric Device Technology Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Manabu Kanesaka
- Priority: JP2005-274786 20050921
- Main IPC: H02H3/00
- IPC: H02H3/00

Abstract:
An overcurrent detecting circuit and reference voltage circuit may reduce the current consumed by an electronic circuit. The circuit may includes a reference load through which a reference current flows, generating a reference voltage. A differential amplifier section is included to amplify the difference in the potentials of two inputs. At least part of a bias current supplied by a constant current source to the differential amplifier section flows to the reference load. A detection voltage, corresponding to a current subject to overcurrent detection, is inputted to one of the two inputs of the differential amplifier section.
Public/Granted literature
- US20070064367A1 Overcurrent detecting circuit and reference voltage generating circuit Public/Granted day:2007-03-22
Information query