Invention Grant
- Patent Title: Semiconductor memory device
- Patent Title (中): 半导体存储器件
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Application No.: US11797804Application Date: 2007-05-08
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Publication No.: US07652927B2Publication Date: 2010-01-26
- Inventor: Fukashi Morishita , Kazutami Arimoto
- Applicant: Fukashi Morishita , Kazutami Arimoto
- Applicant Address: JP Tokyo
- Assignee: Renesas Technology Corp.
- Current Assignee: Renesas Technology Corp.
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-132895 20060511
- Main IPC: G11C16/06
- IPC: G11C16/06

Abstract:
When data “1” is stored in a memory cell, a bit line is driven to an H level (control line drive potential) and the other bit line is driven to an L level (reference potential) when a sense operation is completed. When a verify write operation is initiated, a charge line is driven from an H level (power supply potential) to an L level (reference potential). By the GIDL current from a source line, accumulation of holes is initiated again for a storage node subsequent to discharge of holes, whereby the potential of the storage node rises towards an H level (period α). When the charge line is driven to an H level from an L level, the potential of the storage node further rises (period β).
Public/Granted literature
- US20070263466A1 Semiconductor memory device Public/Granted day:2007-11-15
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