Invention Grant
- Patent Title: Inspection system with material identification
- Patent Title (中): 检验系统具有物料鉴定
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Application No.: US11453545Application Date: 2006-06-14
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Publication No.: US07653176B2Publication Date: 2010-01-26
- Inventor: Richard C. Smith , Robert W. Madden , James M. Connelly
- Applicant: Richard C. Smith , Robert W. Madden , James M. Connelly
- Applicant Address: US MA Woburn
- Assignee: L-3 Communications Security and Detection Systems Inc.
- Current Assignee: L-3 Communications Security and Detection Systems Inc.
- Current Assignee Address: US MA Woburn
- Agency: Wolf, Greenfield & Sacks, P.C.
- Main IPC: H01L27/146
- IPC: H01L27/146 ; G21K5/10

Abstract:
An angular analysis system that can be controlled to receive radiation at a defined angle from a defined focus region. The angular analysis system is used for level 2 inspection in an explosive detection system. Level 2 inspection is provided by a three-dimensional inspection system that identifies suspicious regions of items under inspection. The angular analysis system is focused to gather radiation scattered at defined angles from the suspicious regions. Focusing may be achieved in multiple dimensions by movement of source and detector assemblies in a plane parallel to a plane holding the item under inspection. Focusing is achieved by independent motion of the source and detector assemblies. This focusing arrangement provides a compact device, providing simple, low cost and accurate operation.
Public/Granted literature
- US20060291622A1 Inspection system with material identification Public/Granted day:2006-12-28
Information query
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