Invention Grant
- Patent Title: X-ray generating method, and X-ray generating apparatus
- Patent Title (中): X射线产生方法和X射线产生装置
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Application No.: US12071373Application Date: 2008-02-20
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Publication No.: US07653178B2Publication Date: 2010-01-26
- Inventor: Satoshi Ohsawa
- Applicant: Satoshi Ohsawa
- Applicant Address: JP Tsuchiura JP Tsuchiura
- Assignee: Satoshi Ohsawa,Noriyoshi Sakabe
- Current Assignee: Satoshi Ohsawa,Noriyoshi Sakabe
- Current Assignee Address: JP Tsuchiura JP Tsuchiura
- Agency: Oliff & Berridge, PLC
- Priority: JP2004-241301 20040820
- Main IPC: H01J35/14
- IPC: H01J35/14

Abstract:
A method for generating an X-ray includes the steps of: flattening an electron beam with a circular cross section by means of Lorentz force to form a flat electron beam with a flat cross section under the condition so that an intensity of the flat electron beam per unit area can be set higher than an intensity of said electron beam per unit area; and irradiating the flat electron beam onto a target, thereby generating an X-ray.
Public/Granted literature
- US20090122961A1 X-ray generating method, and X-ray generating apparatus Public/Granted day:2009-05-14
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