Invention Grant
- Patent Title: Method and system for monitoring apparatus
- Patent Title (中): 监控装置的方法和系统
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Application No.: US11857115Application Date: 2007-09-18
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Publication No.: US07653456B2Publication Date: 2010-01-26
- Inventor: Kazuto Kubota , Hisaaki Hatano
- Applicant: Kazuto Kubota , Hisaaki Hatano
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Turocy & Watson, LLP
- Priority: JP2006-356177 20061228
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
There is provided with a monitoring method of monitoring plural apparatuses each having a sensor, including: selecting two or more sample apparatuses out of the plural apparatuses; calculating averages and standard deviations of sensor values detected by the sample apparatuses for each sample apparatus; calculating a confidence interval of the averages and an average of the standard deviations; and calculating an average of sensor values detected by an arbitrary apparatus among the plural apparatuses as an object average and calculating a normal range of the sensor of the arbitrary apparatus from the object average, the confidence interval, and the average of the standard deviations.
Public/Granted literature
- US20080161946A1 METHOD AND SYSTEM FOR MONITORING APPARATUS Public/Granted day:2008-07-03
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