Invention Grant
- Patent Title: Feature selection in mass spectral data
- Patent Title (中): 质谱数据中的特征选择
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Application No.: US11670955Application Date: 2007-02-02
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Publication No.: US07653496B2Publication Date: 2010-01-26
- Inventor: Xiangdong Don Li
- Applicant: Xiangdong Don Li
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F3/00
- IPC: G06F3/00
Abstract:
The present invention provides, inter alia, methods of analyzing mass spectral data. In some embodiments, the methods can be used for differential profiling of samples, such as comparing a sample comprising a compound and a sample comprising metabolites of the same compound. The methods can also be used to identify and isolate biomarkers. Systems for performing the methods, as well as computer-readable media for performing the methods, are also described.
Public/Granted literature
- US20070176088A1 FEATURE SELECTION IN MASS SPECTRAL DATA Public/Granted day:2007-08-02
Information query
