Invention Grant
- Patent Title: Thermoconductimetric analyzer for soldering process improvement
- Patent Title (中): 用于焊接工艺改进的热电偶分析仪
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Application No.: US11405647Application Date: 2006-04-17
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Publication No.: US07653511B2Publication Date: 2010-01-26
- Inventor: Brian Deram , Nick Cinquino , Paul Klimah
- Applicant: Brian Deram , Nick Cinquino , Paul Klimah
- Applicant Address: US IL Des Plaines
- Assignee: Kester, Inc.
- Current Assignee: Kester, Inc.
- Current Assignee Address: US IL Des Plaines
- Agent D. Morgan Tench
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G21C17/00

Abstract:
Performance of a flux in a soldering process is assessed by monitoring the activity of the flux via its electrical conductance measured using a probe having interdigitated metallic traces and a temperature sensor. The measured conductance-temperature time profile provides information useful for selecting a suitable flux formulation and soldering conditions for a given application, for determining the cause of soldering process problems, and for developing improved flux formulations.
Public/Granted literature
- US20070241165A1 Thermoconductimetric analyzer for soldering process improvement Public/Granted day:2007-10-18
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