Invention Grant
- Patent Title: System and method for generating matched contour profiles
- Patent Title (中): 用于产生匹配轮廓轮廓的系统和方法
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Application No.: US11338224Application Date: 2006-01-24
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Publication No.: US07653518B2Publication Date: 2010-01-26
- Inventor: Santosh V. Kulkarni
- Applicant: Santosh V. Kulkarni
- Applicant Address: US CA San Rafael
- Assignee: Autodesk, Inc.
- Current Assignee: Autodesk, Inc.
- Current Assignee Address: US CA San Rafael
- Agency: Patterson & Sheridan, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06T15/00 ; G06T17/00

Abstract:
A method for generating matched contour profiles includes the steps of trimming or extending an input wire to create a modified input wire and slicing a solid part in the plane of the modified input wire to create an intersection wire. The method also includes the steps of imprinting the modified input wire and the intersection wire on a disk to create one or more faces of interest, determining which faces of interest constitute matched contour faces, and extracting edges of an identified matched contour face to create a closed wire. Matched contour profiles enable solid modeling programs to generate solid models that are less prone to failure because the matched contour profile automatically adapts to changes in the shape of the solid model.
Public/Granted literature
- US20060202983A1 System and method for generating matched contour profiles Public/Granted day:2006-09-14
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