Invention Grant
US07653852B2 Semiconductor device and method of adding tester circuit for the same 有权
半导体器件和方法相加的测试电路

Semiconductor device and method of adding tester circuit for the same
Abstract:
A semiconductor device according to an embodiment of the present invention includes: a plurality of clock domains including a plurality of logic circuits operating in accordance with a clock signal; and a control circuit selectively supplying the clock signal to a predetermined number of clock domains selected from the plurality of clock domains based on a control signal.
Information query
Patent Agency Ranking
0/0