Invention Grant
- Patent Title: Polymer sample analyzer
- Patent Title (中): 聚合物样品分析仪
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Application No.: US11298504Application Date: 2005-12-12
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Publication No.: US07655185B2Publication Date: 2010-02-02
- Inventor: Chuichi Watanabe
- Applicant: Chuichi Watanabe
- Applicant Address: JP Fukushima
- Assignee: Frontier Laboratories Ltd.
- Current Assignee: Frontier Laboratories Ltd.
- Current Assignee Address: JP Fukushima
- Agency: Arent Fox LLP
- Priority: JP2005-196597 20050705
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N21/00 ; G01N17/00 ; G01N33/44 ; G01N30/02

Abstract:
Provided is a polymer sample analyzer from which chemical findings on the optical deterioration of a polymer material are available in a very short time. The analyzer is equipped with a gas phase component production unit for producing a plurality of gas phase components, a carrier gas introduction unit for introducing a carrier gas into the gas phase component production unit, a separation unit for separating the gas phase components into each component, and a detection unit 5 for detecting the each component thus separated. The analyzer is equipped further with a UV irradiation unit for exposing the polymer sample to UV ray, an atmospheric gas introduction unit for introducing an atmospheric gas into the gas phase component production unit and a gas switching unit for switching a gas to be introduced into the separation unit between the carrier gas and the atmospheric gas. Under the atmosphere of a gas introduced from the atmospheric gas introduction unit, the polymer sample is deteriorated and decomposed by exposure to UV ray from the UV irradiation unit. After deterioration and decomposition, a gas to be introduced into the separation unit 4 is switched to the carrier gas by the gas switching unit and the gas phase components are introduced into the separation unit by the aid of the carrier gas.
Public/Granted literature
- US20070009385A1 Polymer sample analyzer Public/Granted day:2007-01-11
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