Invention Grant
- Patent Title: Method for producing resist substrates
- Patent Title (中): 抗蚀剂基板的制造方法
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Application No.: US10545261Application Date: 2004-02-24
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Publication No.: US07655381B2Publication Date: 2010-02-02
- Inventor: Wittich Kaule
- Applicant: Wittich Kaule
- Applicant Address: DE Munich
- Assignee: Giesecke & Devrient GmbH
- Current Assignee: Giesecke & Devrient GmbH
- Current Assignee Address: DE Munich
- Agency: Bacon & Thomas, PLLC
- Priority: DE10308317 20030226
- International Application: PCT/EP2004/001817 WO 20040224
- International Announcement: WO2004/077161 WO 20040910
- Main IPC: G03C5/00
- IPC: G03C5/00

Abstract:
The invention relates to a method for producing a substrate having a resist layer in the form of a relief structure, which represents a diffraction structure. The resist layer at least in certain areas adjoins a conductive layer, which scatters the primary electrons and/or produces secondary electrons when the resist layer is exposed by means of an electron beam. With this method the material of the resist layer and the conductive layer and the exposure parameters are adjusted to each other such that the resist layer is also exposed outside the area impinged with the electron beam such that the flanks of the relief structure obtain an inclined form.
Public/Granted literature
- US20060257583A1 Method for producing resist substrates Public/Granted day:2006-11-16
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