Invention Grant
- Patent Title: Method for detecting target substance utilizing probe desorption
- Patent Title (中): 利用探针解吸法检测目标物质的方法
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Application No.: US12029840Application Date: 2008-02-12
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Publication No.: US07655407B2Publication Date: 2010-02-02
- Inventor: Hayato Miyoshi , Takeshi Senga
- Applicant: Hayato Miyoshi , Takeshi Senga
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2007-031557 20070213
- Main IPC: C12Q1/68
- IPC: C12Q1/68

Abstract:
It is an object of the present invention to provide a method for detecting a target substance in a specimen with the use of fine particles, whereby the target substance can be readily detected with the exclusive use of a single type of probe and the detection limit is improved. The present invention provides a method for detecting a target substance in a specimen which comprises the steps of: allowing a complex of a fine particle and a probe to come into contact with a specimen; and detecting changes in physical properties of the fine particle that are caused by desorption of the probe from the fine particle due to interaction between the target substance in the specimen and the probe.
Public/Granted literature
- US20080220435A1 METHOD FOR DETECTING TARGET SUBSTANCE UTILIZING PROBE DESORPTION Public/Granted day:2008-09-11
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