Invention Grant
US07655888B2 Laser scanning microscope and assembly for non-descanned detection
有权
激光扫描显微镜和装配用于非下行检测
- Patent Title: Laser scanning microscope and assembly for non-descanned detection
- Patent Title (中): 激光扫描显微镜和装配用于非下行检测
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Application No.: US12362110Application Date: 2009-01-29
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Publication No.: US07655888B2Publication Date: 2010-02-02
- Inventor: Harald Schadwinkel , Hubert Wahl , Dieter Schau
- Applicant: Harald Schadwinkel , Hubert Wahl , Dieter Schau
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microimaging GmbH
- Current Assignee: Carl Zeiss Microimaging GmbH
- Current Assignee Address: DE Jena
- Agency: Reed Smith LLP
- Priority: DE102008007452 20080131
- Main IPC: G02B7/04
- IPC: G02B7/04

Abstract:
A scanning microscope with a light source which emits illumination light for illuminating a specimen, with at least a first detector for detecting the detection light proceeding from the specimen, and with an objective through which the specimen can be illuminated and detected, wherein the objective is arranged in an illumination beam path and in a detection beam path, and with a second detector for non-descanned detection of the detection light proceeding from the specimen, wherein a compact assembly is provided which comprises a housing which is attached to a microscope stand and which has at least one receptacle for a microscope objective for the illumination beam path and/or detection beam path of the scanning microscope, wherein at least the second detector is arranged in the housing and can be acted upon by specimen light.
Public/Granted literature
- US20090194715A1 LASER SCANNING MICROSCOPE AND ASSEMBLY FOR NON-DESCANNED DETECTION Public/Granted day:2009-08-06
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