Invention Grant
US07655917B2 Radiation image detection apparatus, residual charge amount estimation method for use with the apparatus and program therefor 有权
辐射图像检测装置,与该装置一起使用的剩余电荷量估计方法

  • Patent Title: Radiation image detection apparatus, residual charge amount estimation method for use with the apparatus and program therefor
  • Patent Title (中): 辐射图像检测装置,与该装置一起使用的剩余电荷量估计方法
  • Application No.: US12059054
    Application Date: 2008-03-31
  • Publication No.: US07655917B2
    Publication Date: 2010-02-02
  • Inventor: Naoto Iwakiri
  • Applicant: Naoto Iwakiri
  • Applicant Address: JP Tokyo
  • Assignee: FUJIFILM Corporation
  • Current Assignee: FUJIFILM Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2007-090111 20070330
  • Main IPC: H01L27/00
  • IPC: H01L27/00
Radiation image detection apparatus, residual charge amount estimation method for use with the apparatus and program therefor
Abstract:
A residual charge amount estimation method including the steps of: providing a radiation image detector including pixels, scanning lines, and data lines, each pixel having a collection electrode, a capacitor, and a TFT switch; detecting a leak current flowing out through each data line with the TFT switches being switched OFF; reading out an image signal flowing out through each data line by sequentially switching ON the TFT switches connected to each scanning line on a scanning line-by-scanning line basis; calculating an average leak current per unit saturated pixel from the leak current detected from at least one of the data lines on which a saturated pixel having a saturated value of the image signal is found and the number of saturated pixels; and estimating the amount of residual charges remaining in the unit saturated pixel based on the average leak current.
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