Invention Grant
- Patent Title: Radiation image detection apparatus, residual charge amount estimation method for use with the apparatus and program therefor
- Patent Title (中): 辐射图像检测装置,与该装置一起使用的剩余电荷量估计方法
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Application No.: US12059054Application Date: 2008-03-31
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Publication No.: US07655917B2Publication Date: 2010-02-02
- Inventor: Naoto Iwakiri
- Applicant: Naoto Iwakiri
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2007-090111 20070330
- Main IPC: H01L27/00
- IPC: H01L27/00

Abstract:
A residual charge amount estimation method including the steps of: providing a radiation image detector including pixels, scanning lines, and data lines, each pixel having a collection electrode, a capacitor, and a TFT switch; detecting a leak current flowing out through each data line with the TFT switches being switched OFF; reading out an image signal flowing out through each data line by sequentially switching ON the TFT switches connected to each scanning line on a scanning line-by-scanning line basis; calculating an average leak current per unit saturated pixel from the leak current detected from at least one of the data lines on which a saturated pixel having a saturated value of the image signal is found and the number of saturated pixels; and estimating the amount of residual charges remaining in the unit saturated pixel based on the average leak current.
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