Invention Grant
- Patent Title: Magnetic field measurement system and optical pumping magnetometer
- Patent Title (中): 磁场测量系统和光泵浦磁力仪
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Application No.: US11604767Application Date: 2006-11-28
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Publication No.: US07656154B2Publication Date: 2010-02-02
- Inventor: Ryuuzou Kawabata , Akihiko Kandori
- Applicant: Ryuuzou Kawabata , Akihiko Kandori
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2005-342698 20051128; JP2006-138389 20060518
- Main IPC: G01R33/035
- IPC: G01R33/035 ; G01V3/00 ; G01R33/02

Abstract:
Provided is a highly accurate optical pumping magnetometer, in which a static magnetic field and an oscillating field to be applied to a vapor cell are stabilized. To this end, the optical pumping magnetometer includes: Helmholtz coils for applying a constant static magnetic field to a vapor cell serving as a magnetic field detector; fluxgate magnetometers for detecting environmental magnetic noise in two directions of X-axis direction and Y-axis direction other than Z-axis direction which is a direction for detecting a magnetic field coming out of a measurement object while locating the vapor cell in the center thereof; magnetometer drive circuits for driving the fluxgate magneotometers; current converters for converting outputs of the magnetometer drive circuits into amount of currents; and magnetic field generating coils for generating a magnetic field in a phase opposite to the environmental magnetic noise in the two directions.
Public/Granted literature
- US20070120563A1 Magnetic field measurement system and optical pumping magnetometer Public/Granted day:2007-05-31
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