Invention Grant
US07656186B2 Calibration circuit, semiconductor device including the same, and data processing system
有权
校准电路,包括相同的半导体器件和数据处理系统
- Patent Title: Calibration circuit, semiconductor device including the same, and data processing system
- Patent Title (中): 校准电路,包括相同的半导体器件和数据处理系统
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Application No.: US12213962Application Date: 2008-06-26
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Publication No.: US07656186B2Publication Date: 2010-02-02
- Inventor: Fumiyuki Osanai , Hiroki Fujisawa
- Applicant: Fumiyuki Osanai , Hiroki Fujisawa
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2007-176270 20070704
- Main IPC: H03K17/16
- IPC: H03K17/16

Abstract:
A calibration circuit includes: replica buffers; an up-down counter that changes impedance codes of the replica buffers; latch circuits each holding the impedance codes; an end-determining circuit that activates the latch circuits in response to a completion of impedance adjustments of the replica buffers; and a 32 tCK cycle counter that forcibly activates the latch circuits in response to a lapse of a predetermined period since issuance of the calibration command. Thereby, even when the adjustment is not completed during one calibration period, a subsequent calibration operation can be executed from a previous point.
Public/Granted literature
- US20090009213A1 Calibration circuit, semiconductor device including the same, and data processing system Public/Granted day:2009-01-08
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