Invention Grant
- Patent Title: Method of instrument standardization for a spectroscopic device
- Patent Title (中): 光谱仪器标准化方法
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Application No.: US12119239Application Date: 2008-05-12
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Publication No.: US07656521B2Publication Date: 2010-02-02
- Inventor: Yongdong Wang , Bernhard H. Radziuk , David H. Tracy
- Applicant: Yongdong Wang , Bernhard H. Radziuk , David H. Tracy
- Applicant Address: US MA Boston
- Assignee: PerkinElmer LAS, Inc.
- Current Assignee: PerkinElmer LAS, Inc.
- Current Assignee Address: US MA Boston
- Agency: St. Onge Steward Johnston & Reens LLC
- Priority: DE10207733 20020222
- Main IPC: G01J3/00
- IPC: G01J3/00

Abstract:
In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, andthe transfer function is applied to the test spectral line or spectrum in order to calculate a corrected test spectral line or spectrum.
Public/Granted literature
- US20080246956A1 Method Of Instrument Standardization For A Spectroscopic Device Public/Granted day:2008-10-09
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