Invention Grant
- Patent Title: Overheat detection in thermally controlled devices
- Patent Title (中): 热控装置过热检测
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Application No.: US10912977Application Date: 2004-08-06
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Publication No.: US07656635B2Publication Date: 2010-02-02
- Inventor: Efraim Rotem
- Applicant: Efraim Rotem
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Kacvinsky LLC
- Main IPC: H02H5/04
- IPC: H02H5/04 ; G01K1/08

Abstract:
Systems and methods of overheat detection provide for generating a control signal on a die containing a processor based on an internal temperature of the processor and a control temperature threshold. It can be determined whether to generate a warning temperature event on the die based on a behavior of the control signal. In one embodiment, the warning temperature event provides for initiation of an automated data saving process, which reduces the abruptness of conventional warning temperature shutdowns. Other embodiments provide the user the option of saving his or her work before a shutdown temperature threshold is reached.
Public/Granted literature
- US20060034343A1 Overheat detection in thermally controlled devices Public/Granted day:2006-02-16
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