Invention Grant
US07656712B2 Method and circuit for programming a memory cell, in particular of the NOR flash type 有权
用于编程存储器单元的方法和电路,特别是NOR闪存型

  • Patent Title: Method and circuit for programming a memory cell, in particular of the NOR flash type
  • Patent Title (中): 用于编程存储器单元的方法和电路,特别是NOR闪存型
  • Application No.: US12104118
    Application Date: 2008-04-16
  • Publication No.: US07656712B2
    Publication Date: 2010-02-02
  • Inventor: Carlo LisiTecla Ghilardi
  • Applicant: Carlo LisiTecla Ghilardi
  • Agency: Trop, Pruner & Hu, P.C.
  • Priority: ITMI2007A0777 20070417
  • Main IPC: G11C160/06
  • IPC: G11C160/06
Method and circuit for programming a memory cell, in particular of the NOR flash type
Abstract:
A method programs a memory cell comprising: an initial phase in which a continuous voltage is applied to a drain terminal of said memory cell and a suitable programming voltage signal is applied to a gate terminal thereof; a regulation phase in which a constant voltage value is applied to said gate terminal and a voltage value of said drain terminal is regulated so as to be maintained at a fixed value until a threshold voltage value of said memory cell is set at a desired threshold voltage level; and a disable phase that stops said programming and is triggered as soon as a programming current value of said memory cell goes below a reference current value, said reference current value corresponding to the attainment by the threshold voltage value of said memory cell of the desired threshold voltage value. A programming circuit is suitable for implementing this method.
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