Invention Grant
- Patent Title: Semiconductor memory device
- Patent Title (中): 半导体存储器件
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Application No.: US12059220Application Date: 2008-03-31
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Publication No.: US07656733B2Publication Date: 2010-02-02
- Inventor: Masao Shinozaki , Hajime Sato
- Applicant: Masao Shinozaki , Hajime Sato
- Applicant Address: JP Tokyo
- Assignee: Renesas Technology Corp.
- Current Assignee: Renesas Technology Corp.
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2007-116379 20070426
- Main IPC: G11C7/02
- IPC: G11C7/02

Abstract:
This invention provides a semiconductor memory device with enhanced speed performance or enabling timing adjustment reflected in characteristic variation of memory cells, adapted to suppress an increase in the number of circuit elements. A write dummy bit section comprises a first dummy line and a second dummy line corresponding to complementary bit lines and a plurality of first dummy cells formed to be similar in shape to static memory cells, wherein a write current path is coupled between the first dummy line and the second dummy line. In the write dummy bit section, one voltage level is input to the first dummy line through driver MOSFETs in relation to write signal inputs to the static memory cells and a signal change in the second dummy line precharged at the other voltage level is sensed and output. A timing control circuit deselects a word line selected by an output signal from the write dummy bit section.
Public/Granted literature
- US20080266928A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2008-10-30
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