Invention Grant
- Patent Title: Offset-frequency loop-back calibration
- Patent Title (中): 偏移环回校准
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Application No.: US11522599Application Date: 2006-09-18
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Publication No.: US07657232B2Publication Date: 2010-02-02
- Inventor: Georgios Palaskas , Stefano Pellerano , Ashoke Ravi
- Applicant: Georgios Palaskas , Stefano Pellerano , Ashoke Ravi
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Lee & Hayes, PLLC
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04B1/00 ; H04B15/00 ; H04B1/06

Abstract:
Embodiments of methods and means for calibrating a linearization characteristic within an RF transceiver system are provided. Such embodiments generally include extracting a portion of an output signal and frequency shifting or translating that signal by a predetermined value. The frequency shifted signal is then summed or otherwise introduced into a receiver signal pathway where it is analyzed by digital signal processing or other means to determine if linearization distortion is present. Linearization calibration of a power amplifier, a low-noise amplifier and/or other functionality within the system can then be performed in an automatic, reliable and ongoing manner.
Public/Granted literature
- US20080070512A1 Offset-frequency loop-back calibration Public/Granted day:2008-03-20
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