Invention Grant
- Patent Title: Structural analysis apparatus, structural analysis method, and structural analysis program
- Patent Title (中): 结构分析仪器,结构分析方法和结构分析程序
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Application No.: US11585281Application Date: 2006-10-24
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Publication No.: US07657408B2Publication Date: 2010-02-02
- Inventor: Shigeo Ishikawa
- Applicant: Shigeo Ishikawa
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2006-090224 20060329
- Main IPC: G06F17/10
- IPC: G06F17/10 ; G06F17/50

Abstract:
A structural analysis apparatus automatically sets a boundary between an entire model and a detailed model to thereby obtain a highly accurate solution without intervention by an operator and with fewer man-hours and shorter calculation time. An iso-surface creation step creates a field iso-surface from an analysis result of a mesh model. A detailed mesh model creation step uses the field iso-surface created by the iso-surface creation step to create a detailed mesh model of a part of the mesh model. An analysis step uses the analysis result of the mesh model to perform analysis of the detailed mesh model created by the detailed mesh model creation step. An analysis evaluation step evaluates the analysis result of the detailed mesh model based on the analysis result obtained by the analysis step and analysis result of the mesh model.
Public/Granted literature
- US20070233436A1 Structural analysis apparatus, structural analysis method, and structural analysis program Public/Granted day:2007-10-04
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