Invention Grant
US07657696B2 Method to detect NAND-flash parameters by hardware automatically
有权
通过硬件自动检测NAND闪存参数的方法
- Patent Title: Method to detect NAND-flash parameters by hardware automatically
- Patent Title (中): 通过硬件自动检测NAND闪存参数的方法
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Application No.: US11067501Application Date: 2005-02-25
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Publication No.: US07657696B2Publication Date: 2010-02-02
- Inventor: Zhiqiang J. Su , Qasim R. Shami , Hongping Liu , Hui Lan
- Applicant: Zhiqiang J. Su , Qasim R. Shami , Hongping Liu , Hui Lan
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agent Christopher P. Maiorana, PC
- Main IPC: G06F13/00
- IPC: G06F13/00 ; G06F13/28 ; G06F9/26 ; G06F9/34 ; G06F9/00 ; G06F9/24 ; G06F15/177
Abstract:
A method for automatically detecting a plurality of parameters for a NAND-Flash memory. A first step of the method may include generating a plurality of address cycles for the NAND-Flash memory. A second step may set an address number parameter of the parameters based on (i) a first number of the address cycles generated and (ii) a status signal generated by the NAND-Flash memory responsive to the address cycles. A third step generally includes generating at least one read cycle for the NAND-Flash memory after determining the address number parameter. A fourth step may set a page size parameter of the parameters based on (i) a second number of the read cycles generated and (ii) the status signal further responsive to the read cycles.
Public/Granted literature
- US20060195650A1 Method to detect NAND-flash parameters by hardware automatically Public/Granted day:2006-08-31
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