Invention Grant
- Patent Title: Data compression read mode for memory testing
- Patent Title (中): 用于内存测试的数据压缩读取模式
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Application No.: US11780734Application Date: 2007-07-20
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Publication No.: US07657802B2Publication Date: 2010-02-02
- Inventor: Giovanni Naso
- Applicant: Giovanni Naso
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Priority: ITRM2003A0040 20030131
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A first series combination of bit match circuits compares a predetermined bit position in data words that are involved in a compression operation. The first series combination compares the values in the predetermined bit position to determine if they are all a logical zero. A second series combination of bit match circuits compares the same predetermined bit position in the data words. The second series combination compares the values to determine if they are all a logical one. If either condition is true, the value of the bit is output through an output buffer. If both conditions are false, the output buffer is placed in a high impedance state to indicate an error condition exists in that bit position.
Public/Granted literature
- US20080016419A1 DATA COMPRESSION READ MODE FOR MEMORY TESTING Public/Granted day:2008-01-17
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