Invention Grant
- Patent Title: Method and apparatus for automated manufacture of a probe tip
- Patent Title (中): 用于自动制造探头尖端的方法和装置
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Application No.: US11517204Application Date: 2006-09-07
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Publication No.: US07658000B2Publication Date: 2010-02-09
- Inventor: Stephen James Sufka , Thane Fleming Tahti , David Ray Price , Steven Francis Roy , Kristoffer Wayne Wickstead
- Applicant: Stephen James Sufka , Thane Fleming Tahti , David Ray Price , Steven Francis Roy , Kristoffer Wayne Wickstead
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Cantor Colburn LLP
- Main IPC: H01R43/00
- IPC: H01R43/00

Abstract:
A method for attaching a proximity probe offset to an axis defining an extension cable. The method includes a sensing element; a cylindrical part molded with a moldable material; a recess configured in one of two opposing ends defining the cylindrical part to receive the sensing element; a first and a second ferrule each extending from opposing surfaces defining an exterior of the cylindrical part, a first axis defining the first and second ferrules being offset from a second axis defining the cylindrical part; and an extension cable operably attached to the sensing element via the first and second ferrules, the sensing element being disposed offset relative to the extension cable.
Public/Granted literature
- US20070000118A1 Method and apparatus for automated manufacture of a probe tip Public/Granted day:2007-01-04
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