Invention Grant
- Patent Title: Length measuring arrangement
- Patent Title (中): 长度测量布置
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Application No.: US12214454Application Date: 2008-06-19
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Publication No.: US07658014B2Publication Date: 2010-02-09
- Inventor: Andreas Peterlechner
- Applicant: Andreas Peterlechner
- Applicant Address: DE Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DE Traunreut
- Agency: Brinks Hofer Gilson & Lione
- Priority: DE102007033574 20070719
- Main IPC: G01D5/347
- IPC: G01D5/347 ; G01B7/02 ; G01B11/02

Abstract:
A length measuring arrangement for measuring the relative position of two objects, the length measuring arrangement including a housing made of a non-magnetic material and longitudinally extending in a measuring direction. The length measuring arrangement including a scale in the housing, the scale having a measuring graduation, a first guide face and a second guide face which extends perpendicular to the first guide face. A mounting piece attachable to one of the two objects rigidly in the measuring direction and resiliently transversely to the measuring direction. The length measuring arrangement including a scanning carriage that scans the measuring graduation, wherein the scanning carriage is coupled to the mounting piece rigidly in the measuring direction and resiliently transversely to the measuring direction, and the scanning carriage is linearly guided in the measuring direction on the first and second guide faces and is pressed against the first and second guide faces. A pressure force is generated by a magnetic force between at least one first element of the scanning carriage and a second element provided on the housing.
Public/Granted literature
- US20090019716A1 Length measuring arrangement Public/Granted day:2009-01-22
Information query
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