Invention Grant
- Patent Title: Distortion detector
- Patent Title (中): 失真检测器
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Application No.: US11663284Application Date: 2005-09-30
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Publication No.: US07658118B2Publication Date: 2010-02-09
- Inventor: Sigehiro Yosiuti , Shusaku Kawasaki , Hiroaki Mori , Yasunori Matsukawa , Yasunobu Kobayashi
- Applicant: Sigehiro Yosiuti , Shusaku Kawasaki , Hiroaki Mori , Yasunori Matsukawa , Yasunobu Kobayashi
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2004-292224 20041005
- International Application: PCT/JP2005/018110 WO 20050930
- International Announcement: WO2006/038553 WO 20060413
- Main IPC: G01L1/22
- IPC: G01L1/22 ; G01B7/16

Abstract:
A strain detector includes a bridge circuit having at least two strain resistance elements, a substrate, a first fixed member, and a second fixed member. The substrate has a circuit portion electrically connected to the strain resistance elements. The strain resistance elements are arranged on the substrate. The first fixed member is fixed to a center of an area, where an outer periphery of the area is set at a position at which the strain resistance elements are arranged. The second fixed member is fixed outside the position, where the strain resistance elements are arranged at the substrate. A center of an axis of the first fixed member, a center of an axis of the second fixed member, and the center of the area are positioned on a straight line, and the first fixed member and the second fixed member are arranged on two mutually opposed surfaces of the substrate.
Public/Granted literature
- US20080245157A1 Distortion Detector Public/Granted day:2008-10-09
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