Invention Grant
US07659145B2 Semiconductor device and method of forming stepped-down RDL and recessed THV in peripheral region of the device
有权
在器件的外围区域形成降压RDL和凹入THV的半导体器件和方法
- Patent Title: Semiconductor device and method of forming stepped-down RDL and recessed THV in peripheral region of the device
- Patent Title (中): 在器件的外围区域形成降压RDL和凹入THV的半导体器件和方法
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Application No.: US12172817Application Date: 2008-07-14
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Publication No.: US07659145B2Publication Date: 2010-02-09
- Inventor: Byung Tai Do , Heap Hoe Kuan , Reza A. Pagaila , Linda Pei Ee Chua
- Applicant: Byung Tai Do , Heap Hoe Kuan , Reza A. Pagaila , Linda Pei Ee Chua
- Applicant Address: SG Singapore
- Assignee: STATS ChipPAC, Ltd.
- Current Assignee: STATS ChipPAC, Ltd.
- Current Assignee Address: SG Singapore
- Agent Robert D. Atkins
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A semiconductor die has a peripheral region around the die. An insulating layer is formed over the semiconductor die. A portion of the insulating layer and peripheral is removed to form a recess around the semiconductor die. A conductive layer is deposited over the insulating layer and recess. The conductive layer is electrically connected to contact pads on the semiconductor die and conforms to a step into the recess. A gap is created through the conductive layer and peripheral region around the semiconductor die. An insulating material is deposited in the gap. A portion of the insulating material is removed to form a through hole via (THV). A conductive material is deposited in the THV to form a conductive THV. The conductive THV is recessed with respect to a surface of the semiconductor die. The conductive THV is electrically connected to the conductive layer.
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