Invention Grant
- Patent Title: Test handler including single-door-type stockers
- Patent Title (中): 测试处理器,包括单门式储料器
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Application No.: US11723491Application Date: 2007-03-20
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Publication No.: US07659711B2Publication Date: 2010-02-09
- Inventor: Yeon-gyu Song , Ho-gyung Kim , Kyong-eob Eom , Seung-hee Lee , Jae-ho Song
- Applicant: Yeon-gyu Song , Ho-gyung Kim , Kyong-eob Eom , Seung-hee Lee , Jae-ho Song
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2006-0026045 20060322
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/28

Abstract:
A handler may include a handler system main body used for testing semiconductor devices; an open-type stocker portion on a front side of the handler system main body; and/or a plurality of single-door-type stockers in the open-type stocker portion. The single-door-type stockers may include windows on upper parts of front sides of the single-door-type stockers. The front sides of the single-door-type stockers may be protected. The handler also may include a front top door on an upper part of the front side of the handler system main body; locking stoppers below the windows of the single-door-type stockers; safety sensors on sides of the open-type stocker portion; and/or a working table in front of the open-type stocker portion. The open-type stocker portion may be below the front top door. The safety sensors may stop the handler when the single-door-type stockers are not closed.
Public/Granted literature
- US20070221548A1 Test handler including single-door-type stockers Public/Granted day:2007-09-27
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