Invention Grant
- Patent Title: System and method for process measurement
- Patent Title (中): 过程测量的系统和方法
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Application No.: US10964375Application Date: 2004-10-13
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Publication No.: US07659712B2Publication Date: 2010-02-09
- Inventor: Francisco M. Gutierrez
- Applicant: Francisco M. Gutierrez
- Applicant Address: US TX Addison
- Assignee: Dresser, Inc.
- Current Assignee: Dresser, Inc.
- Current Assignee Address: US TX Addison
- Agency: Fish & Richardson P.C.
- Main IPC: G01B7/14
- IPC: G01B7/14

Abstract:
Process measurement may be achieved by systems and techniques generating output signals based on the measured process. In certain implementations, process measurement systems and techniques may include the ability to generate a magnetic field and successively change the orientation of the magnetic field. The systems and techniques may also include the ability to sense the presence of at least a first orientation of the magnetic field with a magnetic field sensor including a conductor and at least two Wiegand-effect conductors as the magnetic field orientation is changed and to generate an electrical pulse in the conductor with each Wiegand-effect conductor when the first orientation of the magnetic field is sensed.
Public/Granted literature
- US20060076948A1 System and method for process measurement Public/Granted day:2006-04-13
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