Invention Grant
- Patent Title: Sensor for measuring magnetic flux
- Patent Title (中): 用于测量磁通量的传感器
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Application No.: US11667292Application Date: 2005-11-09
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Publication No.: US07659717B2Publication Date: 2010-02-09
- Inventor: Luc Van Bockstal
- Applicant: Luc Van Bockstal
- Applicant Address: BE Leuven
- Assignee: Metis Instruments & Equipment N.V.
- Current Assignee: Metis Instruments & Equipment N.V.
- Current Assignee Address: BE Leuven
- Agency: Bacon & Thomas, PLLC
- Priority: GB0424717.7 20041109
- International Application: PCT/BE2005/000163 WO 20051109
- International Announcement: WO2006/050587 WO 20060518
- Main IPC: G01R33/12
- IPC: G01R33/12

Abstract:
A sensor for measuring the magnetic flux of a sample material includes a first pick-up coil for generating a pick-up signal and a second pick-up coil for generating another pick-up signal. The first and second pick-up coils are arranged such that they have a substantially equal sensitivity with respect to a background field and a substantially equal sensitivity with respect to deviations from a central position within the coils. The coils have a different sensitivity with respect to a field generated by the sample. The sensor can be used to measure the magnetic response of magnetic material in a varying background field, e.g. for full hysteresis measurement equipment using pulsed magnetic fields. The invention also has applications in a meter for magnetic moment and in measuring induced currents in metallic samples, where it is necessary to make a measurement in the presence of an unwanted background field.
Public/Granted literature
- US20080007258A1 Sensor for Measuring Magnetic Flux Public/Granted day:2008-01-10
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