A testing circuit and method for a liquid crystal display device are presented. The circuit comprises: a substrate, a plurality of pixels formed on the substrate and having n sub-pixels, a plurality of signal paths, and a plurality of p shorting bars, The plurality of signal paths is formed on the substrate and connected to the sub-pixels correspondingly; the p shorting bars are formed on the substrate and respectively connected to (p×m+1)th, (p×m+2)th, (p×m+3)th . . . , (p×m+p)th numbered signal paths The method comprises: dividing the p shorting bars into n groups; and applying testing signals respectively to the shorting bars of every group. The method also comprises: dividing the p shorting bars into groups by odd-even sequence; and applying testing signals respectively to every group, so as to effectively increase the testing efficiency of array and cell tests in fabrication of the device.