A pulsed dynamic logic environment metric measurement circuit provides self-referenced, low area/cost and low power measurement of circuit environment metrics, such as supply voltage. A cascade of dynamic logic stages is clocked with a pulse having a width substantially independent of an environment metric to which the delay of the dynamic logic stages is sensitive. The number of dynamic logic stages that evaluate within a given pulse provides a direct measure of the pulse width, and thus the value of the circuit metric. The pulse may be generated from a logical exclusive-OR combination of a clock signal provided from two circuit paths that differ in sensitivity to the environment metric to be measured. One circuit path may have a delay substantially determined only by wire delay, which is not substantially sensitive to circuit environment metrics such as power supply voltage.