Invention Grant
- Patent Title: Method and apparatus for testing RFID devices
- Patent Title (中): RFID设备测试方法和设备
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Application No.: US12022933Application Date: 2008-01-30
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Publication No.: US07659822B2Publication Date: 2010-02-09
- Inventor: Curtis Lee Carrender , Mark A. Hadley
- Applicant: Curtis Lee Carrender , Mark A. Hadley
- Applicant Address: US CA Morgan Hill
- Assignee: Alien Technology Corporation
- Current Assignee: Alien Technology Corporation
- Current Assignee Address: US CA Morgan Hill
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G08B13/14
- IPC: G08B13/14 ; G06K7/00
Abstract:
A method and apparatus for testing RFID straps. Arrays of RFID straps in a roll-to-roll process are coupled to an array of test elements. RF programming and interrogation signals are frequency and time multiplexed to the RFID array. Return signals are detected to determine sensitivity and programmability parameters of the RFID straps.
Public/Granted literature
- US20080204244A1 METHOD AND APPARATUS FOR TESTING RFID DEVICES Public/Granted day:2008-08-28
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