Invention Grant
US07659971B2 Lensometers and wavefront sensors and methods of measuring aberration
有权
透镜计和波前传感器以及测量像差的方法
- Patent Title: Lensometers and wavefront sensors and methods of measuring aberration
- Patent Title (中): 透镜计和波前传感器以及测量像差的方法
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Application No.: US12019614Application Date: 2008-01-24
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Publication No.: US07659971B2Publication Date: 2010-02-09
- Inventor: Laurence Warden , John Ferro , Andreas W. Dreher , William G. Foote
- Applicant: Laurence Warden , John Ferro , Andreas W. Dreher , William G. Foote
- Applicant Address: US CA Vista
- Assignee: Ophthonix, Inc.
- Current Assignee: Ophthonix, Inc.
- Current Assignee Address: US CA Vista
- Agency: Morrison & Foerster LLP
- Main IPC: G01B9/00
- IPC: G01B9/00

Abstract:
Wavefront measuring systems and methods are disclosed which may be employed, for example, in detecting phase aberrations in a spectacle lens and in an eye. Various embodiments include disposing a modulation pattern in the path of a return beam from the spectacle lens or the eye, and imaging a diffraction pattern at a self-imaging plane relative to the modulation pattern with a detector. The diffraction pattern is analyzed and the results are used to produce a representation of the wavefront phase characteristics that describe aberrations in the lens or eye being measured. Illumination and processing techniques for improving the measurement results are disclosed. Various embodiments comprise systems adaptable to both measure aberrations in lenses in spectacles as well as in a patient's eyes.
Public/Granted literature
- US20080180635A1 LENSOMETERS AND WAVEFRONT SENSORS AND METHODS OF MEASURING ABERRATION Public/Granted day:2008-07-31
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