Invention Grant
- Patent Title: Scanning microscope
- Patent Title (中): 扫描显微镜
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Application No.: US10596234Application Date: 2004-10-13
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Publication No.: US07660035B2Publication Date: 2010-02-09
- Inventor: Ingo Böhm , Heinrich Ulrich , Werner Knebel
- Applicant: Ingo Böhm , Heinrich Ulrich , Werner Knebel
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Darby & Darby
- Priority: DE10356826 20031205
- International Application: PCT/EP2004/052519 WO 20041013
- International Announcement: WO2005/054924 WO 20050616
- Main IPC: G02B21/06
- IPC: G02B21/06

Abstract:
A scanning microscope includes at least one light source, an acousto-optical element, a beam deflection device and a beam guiding device. The at least one light source generates an illuminating light beam. The acousto-optical element spatially splits a sub-light beam from the illuminating light beam and adjusts an optical power of the illuminating light beam. The beam deflection device scans the illuminating light beam over or through a sample. The beam guiding device directs the sub-light beam onto the sample.
Public/Granted literature
- US20070152556A1 Scanning microscope Public/Granted day:2007-07-05
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