Invention Grant
- Patent Title: Through-type multilayer capacitor array
- Patent Title (中): 通式多层电容阵列
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Application No.: US12339519Application Date: 2008-12-19
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Publication No.: US07660100B2Publication Date: 2010-02-09
- Inventor: Masaaki Togashi
- Applicant: Masaaki Togashi
- Applicant Address: JP Tokyo
- Assignee: TDK Corporation
- Current Assignee: TDK Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JPP2007-340442 20071228
- Main IPC: H01G4/228
- IPC: H01G4/228

Abstract:
A through-type multilayer capacitor array comprises a capacitor body, and two first signal terminal electrodes, two second signal terminal electrodes, two grounding terminal electrodes, a first outer connecting conductor, and a second outer connecting conductor. The capacitor body includes a grounding inner electrode, and first to fourth signal inner electrodes. The grounding inner electrode is arranged to oppose the first or second signal inner electrode with an insulator layer in between and oppose the third or fourth signal inner electrode with an insulator layer in between while being connected to the grounding terminal electrodes. The first signal inner electrode is connected to the first signal terminal electrodes and first outer connecting conductor. The third signal inner electrode is connected to the second signal terminal electrodes and the second outer connecting conductor. The second and fourth signal inner electrodes are respectively connected to the first and second outer connecting conductor.
Public/Granted literature
- US20090168298A1 THROUGH-TYPE MULTILAYER CAPACITOR ARRAY Public/Granted day:2009-07-02
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