Invention Grant
US07660175B2 Integrated circuit, method for acquiring data and measurement system
有权
集成电路,采集数据和测量系统的方法
- Patent Title: Integrated circuit, method for acquiring data and measurement system
- Patent Title (中): 集成电路,采集数据和测量系统的方法
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Application No.: US12040719Application Date: 2008-02-29
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Publication No.: US07660175B2Publication Date: 2010-02-09
- Inventor: Dieter Kohlert , Erhard Sixt , Rainer Holmer , Georg Seidemann , Berthold Schuderer , Gunther Mackh , Sabine Penka , Grit Schwalbe-Dietrich , Bernhard Duschinger , Josef Hermann
- Applicant: Dieter Kohlert , Erhard Sixt , Rainer Holmer , Georg Seidemann , Berthold Schuderer , Gunther Mackh , Sabine Penka , Grit Schwalbe-Dietrich , Bernhard Duschinger , Josef Hermann
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
An embodiment of an integrated circuit comprises a plurality of cells. Each cell comprises a first supply node, a second supply node, a series connection with a first transistor, a second transistor and an electrical element. The series connection is coupled between the first and the second supply node. The electrical element includes a first and a second node. A third transistor is coupled between the first node of the electrical element and a first output node of the cell and a fourth transistor is coupled between the second node of the electrical element and the second output node of the cell. A control terminal of the first, the third and the fourth transistor is coupled to a first control node of the cell and a control terminal of the second transistor is coupled to a second control node of the cell.
Public/Granted literature
- US20090219773A1 Integrated Circuit, Method for Acquiring Data and Measurement System Public/Granted day:2009-09-03
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