Invention Grant
- Patent Title: Scatter compensation in an X-ray system
- Patent Title (中): 在X射线系统中的散射补偿
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Application No.: US11719555Application Date: 2005-11-17
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Publication No.: US07660381B2Publication Date: 2010-02-09
- Inventor: Johannes Henricus Maria Joosten , Miels Noordhoek , Herman Stegehuis
- Applicant: Johannes Henricus Maria Joosten , Miels Noordhoek , Herman Stegehuis
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP04105997 20041123
- International Application: PCT/IB2005/053802 WO 20051117
- International Announcement: WO2006/056915 WO 20060601
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
Scatter compensation is achieved in an X-ray imaging system by providing collimation means in the form of shutters (12) to collimate the primary X-ray beam (1) such that the radiation (8) transmitted through a subject (4) to be imaged is incident substantially centrally on the active part (14) of an image detector (3), so as to define an active border (14b), in respect of which scatter levels can be measured. An electrical signal (104) representative of the scatter level is subtracted from the electrical signal (7) representative of the radiation (8) transmitted through the subject, to obtain a scatter-compensated image signal (106).
Public/Granted literature
- US20090147911A1 SCATTER COMPENSATION IN AN X-RAY SYSTEM Public/Granted day:2009-06-11
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