Invention Grant
- Patent Title: Pattern recognition apparatus and method
- Patent Title (中): 模式识别装置及方法
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Application No.: US11371655Application Date: 2006-03-09
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Publication No.: US07660465B2Publication Date: 2010-02-09
- Inventor: Osamu Yamaguchi
- Applicant: Osamu Yamaguchi
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Turocy & Watson, LLP
- Priority: JP2005-067500 20050310
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A pattern recognition apparatus compares an image including a photographed object to be recognized with a model previously registered in a table and recognizes the object to be recognized, and the pattern recognition apparatus includes an image input part 1, a feature point extraction part 2, a triangulation part 3, a feature point selection part 4, a basis calculation part 5, a partial pattern structure part 6, an index calculation part 7, a table registration part 8, a pattern similarity calculation part 9, a hypothesis information generation part 10, and an object recognition part 11. Plural feature points are extracted from the image of the object to be recognized, triangulation of a feature point set is obtained, and a combination of plural feature points is selected from plural feature points in accordance with the extracted triangulation.
Public/Granted literature
- US20060204079A1 Pattern recognition apparatus and method Public/Granted day:2006-09-14
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