Invention Grant
US07660624B2 Method and x-ray system for detecting position changes of a medical implant
有权
用于检测医疗植入物的位置变化的方法和x射线系统
- Patent Title: Method and x-ray system for detecting position changes of a medical implant
- Patent Title (中): 用于检测医疗植入物的位置变化的方法和x射线系统
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Application No.: US10822382Application Date: 2004-04-12
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Publication No.: US07660624B2Publication Date: 2010-02-09
- Inventor: Christian Georg , Joachim Hornegger , Klaus Jochen Klose , Volkmar Welker
- Applicant: Christian Georg , Joachim Hornegger , Klaus Jochen Klose , Volkmar Welker
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Schiff Hardin LLP
- Priority: DE10316558 20030410
- Main IPC: A61B5/05
- IPC: A61B5/05

Abstract:
In a method and apparatus to detect position changes of an implant x-ray detectable markers are arranged in the environment of the implant, and 2D x-ray exposures are obtained at temporal intervals of a region containing the implant in which a distribution of the markers as well as of marked points of the implant are visible in each 2D x-ray exposure. A first of the 2D x-ray exposures is obtained at a first point in time from one projection direction, and a second of the 2D x-ray exposures is obtained at a second point in time from another projection direction. The distribution of the markers and marked points is determined in the first and second 2D x-ray exposure by an evaluation device, and from the distributions a degree of probability is calculated that the distribution of the first 2D x-ray exposure and the distribution of the second 2D x-ray exposure are projections of the same three-dimensional distribution of markers and marked points. An automated detection of position changes by implants with reduced x-ray exposure for the patient is facilitated.
Public/Granted literature
- US20050020913A1 Method and x-ray system for detecting position changes of a medical implant Public/Granted day:2005-01-27
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