Invention Grant
- Patent Title: Nucleic acid base sequence determining method and inspecting system
- Patent Title (中): 核酸碱基序列测定方法及检测系统
-
Application No.: US10315143Application Date: 2002-12-10
-
Publication No.: US07660676B2Publication Date: 2010-02-09
- Inventor: Satoshi Hirata , Satoshi Mitsuyama , Hitoshi Matsuo , Shinichi Fukuzono , Hiroyuki Suzuki
- Applicant: Satoshi Hirata , Satoshi Mitsuyama , Hitoshi Matsuo , Shinichi Fukuzono , Hiroyuki Suzuki
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Stites & Harbison PLLC
- Agent Juan Carlos A. Marquez, Esq.
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
When the nucleic-acid base sequence of A, C, G, and T (or U) is determined by interpreting fluorescent-light intensity waveform data acquired by measuring nucleic-acid fragments, it is desirable to determine, with a high-accuracy, the base sequence at a location at which the data interpretation is difficult. In order to accomplish this object, the data interpretation is performed by making reference to information acquired by performing the statistical processing to plural pieces of fluorescent-light intensity waveform data corresponding to already-known base sequences. This method allows the determination of the nucleic-acid base sequence at the above-described location.
Public/Granted literature
- US20040110137A1 Nucleic acid base sequence determining method and inspecting system Public/Granted day:2004-06-10
Information query